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Characterization of electromagnetic fields close to microwave devices using electric dipole probes
Author(s) -
Bouchelouk Lakhdar,
Riah Zouheir,
Baudry David,
Kadi Moncef,
Louis Anne,
Mazari Bélahcène
Publication year - 2008
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.20274
Subject(s) - microwave , dipole , electric field , characterization (materials science) , antenna (radio) , microwave imaging , electromagnetic field , near and far field , sensitivity (control systems) , dipole antenna , physics , optics , optoelectronics , materials science , electronic engineering , electrical engineering , engineering , quantum mechanics
A methodology to thoroughly characterize an electric near‐field probe based on small dipole antenna is presented. Both theoretical investigations and experimental direct measurements determine the various characteristics of the probe such as selectivity, sensitivity and spatial resolution. Results show the efficiency of the probe for diagnosing electromagnetic phenomena. © 2008 Wiley Periodicals, Inc. Int J RF and Microwave CAE, 2008.