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On the thru‐reflect‐line (TRL) numerical calibration and error analysis for parameter extraction of circuit model
Author(s) -
Li Lin,
Wu Ke,
Russer Peter
Publication year - 2006
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.20167
Subject(s) - resistor , calibration , microstrip , discontinuity (linguistics) , electrical impedance , electronic engineering , equivalent circuit , scattering parameters , line (geometry) , characteristic impedance , microwave , algorithm , engineering , computer science , mathematics , voltage , electrical engineering , mathematical analysis , telecommunications , geometry , statistics
In this work, a resistor standard is introduced into our previously proposed numerical thru‐reflect‐line (TRL) calibration procedure in order to determine the characteristic impedance of the line standard of calibration on the basis of a deterministic method of moments (MoM) algorithm. A comprehensive analytical derivation is presented with regards to electrical properties of such a resistor standard in comparison to other standards. In addition, an error analysis is detailed, which reveals correlations of characteristic parameters in connection with equivalent circuit model development from the conversions from field‐based S ‐parameters to circuit‐based Y ‐ or Z ‐parameters. Interesting properties and criteria are derived, allowing accurate parameter extractions. To validate the proposed numerical TRL calibration procedure with this new resistor standard concept and the developed error analysis, the characteristic impedance of a microstrip line is extracted from a commercial software. In addition, a further example with microstrip discontinuity is shown and the effectiveness of the proposed technique is verified. © 2006 Wiley Periodicals, Inc. Int J RF and Microwave CAE, 2006.