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Large‐signal characterization of microwave power devices
Author(s) -
Teyssier JeanPierre,
Barataud Denis,
Charbonniaud Christophe,
De Groote Fabien,
Mayer Markus,
Nébus JeanMichel,
Quéré Raymond
Publication year - 2005
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.20113
Subject(s) - microwave , electronic engineering , amplifier , rf power amplifier , characterization (materials science) , power (physics) , nonlinear system , time domain , electrical engineering , signal (programming language) , computer science , engineering , microwave power , radio frequency , telecommunications , physics , optics , cmos , quantum mechanics , computer vision , programming language
This article presents an overview of nonlinear measurement techniques for microwave power devices. Several useful measurement techniques available in Europe are described. Trends, especially in the area of high‐power and time‐domain measurements, are discussed. A summary of the TARGET (“Top Amplifier Research Group in a European Team”) Network of Excellence (NOE) related tasks is described, in order to show how TARGET can improve the European nonlinear‐measurement capabilities. © 2005 Wiley Periodicals, Inc. Int J RF and Microwave CAE 15, 2005.