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Characterization of millimeter‐wave antenna using photonic measurement techniques
Author(s) -
Togo H.,
Sasaki A.,
Hirata A.,
Nagatsuma T.
Publication year - 2004
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.20012
Subject(s) - electric field , microwave , millimeter , extremely high frequency , bandwidth (computing) , physics , field (mathematics) , system of measurement , optics , antenna (radio) , electromagnetic field , electrical engineering , engineering , telecommunications , mathematics , quantum mechanics , astronomy , pure mathematics
This article describes an electric‐field measurement system that is based on electro‐optic sampling (EOS). This system is able to map near‐ and far‐field patterns of millimeter waves radiated from antennas by scanning the electric‐field sensor probe. With the bandwidth set to more than 150 GHz, it can detect an electric field of less than 1.0 V/m at 60 GHz. This electric field is about one‐tenth the field limit detectable by conventional microwave EOS systems. A comparison of measured and calculated electric fields in both the frequency‐ and time‐domains demonstrates the accuracy and usefulness of the system. © 2004 Wiley Periodicals, Inc. Int J RF and Microwave CAE 14: 290–297, 2004.