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Extraction of S ‐parameters from time domain reflectometry and transmission measurements using rational functions
Author(s) -
Pannala Sreemala,
Swaminathan Madhavan
Publication year - 2003
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.10064
Subject(s) - reflectometry , time domain , deconvolution , scattering parameters , rational function , jitter , transmission line , calibration , matrix pencil , electronic engineering , optics , algorithm , materials science , mathematics , computer science , mathematical analysis , physics , engineering , telecommunications , statistics , computer vision , eigenvalues and eigenvectors , quantum mechanics
The extraction of the broad band S ‐parameter response from transient reflection and transmission measurements is discussed. The proposed method uses the generalized pencil‐of‐function method, recursive deconvolution, and calibration structures to obtain a response using rational functions. A low loss printed circuit board plane and a lossy thin film plane are characterized to capture the two‐port S ‐parameters. The results are compared with network analyzer measurements. The effects of the measurement parameters such as the sampling interval, time window, and number of averages are shown. The effect of time jitter on the extracted frequency response is quantified through repeated measurements. © 2003 Wiley Periodicals, Inc. Int J RF and Microwave CAE 13: 74–85, 2003.