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Yield‐driven electromagnetic optimization via space mapping‐based neuromodels
Author(s) -
Bandler John W.,
RayasSánchez José E.,
Zhang QiJun
Publication year - 2002
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.10015
Subject(s) - space mapping , microwave , electromagnetics , design for manufacturability , yield (engineering) , microstrip , computational electromagnetics , computer science , process (computing) , filter (signal processing) , electronic engineering , engineering , mechanical engineering , physics , electrical engineering , telecommunications , quantum mechanics , thermodynamics , operating system , electromagnetic field
Accurate yield optimization and statistical analysis of microwave components are crucial ingredients for manufacturability‐driven designs in a time‐to‐market development environment. Yield optimization requires intensive simulations to cover the entire statistic of possible outcomes of a given manufacturing process. Performing direct yield optimization using accurate full‐wave electromagnetic simulations does not appear feasible. In this article, an efficient procedure to realize electromagnetics (EM) based yield optimization and statistical analysis of microwave structures using space mapping‐based neuromodels is proposed. Our technique is illustrated by the EM‐based statistical analysis and yield optimization of a high temperature superconducting (HTS) microstrip filter. © 2002 John Wiley & Sons, Inc. Int J RF and Microwave CAE 12: 79–89, 2002.