Premium
Transmissionselektronenmikroskopie‐Untersuchung (TEM) von geglühten Gamma‐Aluminiumoxid‐Beschichtungen für Schneidwerkzeuge und von Gamma‐Aluminiumoxid beschichteten Schneidwerkzeugen nach dem Einsatz in Zerspanversuchen
Author(s) -
Müller M. G. J.,
Mayer J.
Publication year - 2013
Publication title -
materialwissenschaft und werkstofftechnik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.285
H-Index - 38
eISSN - 1521-4052
pISSN - 0933-5137
DOI - 10.1002/mawe.201300181
Subject(s) - nanocrystalline material , materials science , transmission electron microscopy , metallurgy , wafer , sputter deposition , silicon nitride , composite material , nuclear chemistry , sputtering , silicon , chemistry , nanotechnology , thin film
Among the transition phases of alumina, the gamma alumina‐phase has a high potential for the use as hard coating in many technological applications, because it exhibits excellent properties e. g. high hot hardness and high thermal stability. In the present work, transmission electron microscopic (TEM) studies are used to investigate the phase stability of nanocrystalline gamma alumina‐coatings. These coatings were deposited by means of magnetron sputter ion plating (MSIP) on cutting inserts with a titanium‐aluminum‐nitride‐interlayer or directly onto silicon‐wafers. Before transmission electron microscope‐investigation, the samples were annealed or used in cutting tests.