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EBSD‐Orientierungsanalyse monokristalliner Diamanten für Diamant‐Metall Verbunde – Einfluss der Probenvorbereitung
Author(s) -
Tillmann W.,
Biermann D.,
Weihs C.,
Ferreira M.,
Rautert C.,
Raabe N.
Publication year - 2012
Publication title -
materialwissenschaft und werkstofftechnik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.285
H-Index - 38
eISSN - 1521-4052
pISSN - 0933-5137
DOI - 10.1002/mawe.201200954
Subject(s) - electron backscatter diffraction , diamond , materials science , monocrystalline silicon , orientation (vector space) , metallurgy , microstructure , composite material , geometry , silicon , mathematics
This paper focuses on a new field of application for the EBSD‐technique. Generally, EBSD‐mappings are performed on different metal alloys used for quality assurance and to get information about the microstructure regarding grain orientation, grain size and distribution. In contrast, the orientation determination of monocrystalline diamond grains with an EBSD system is not a conventional method. Thus, this work describes the EBSD testing sequence in detail and illustrates the preparation of orientation data for a statistical design. Furthermore, dependencies of the sample preparation, alignment to the detector, and the analyzed position on the diamond on the quality of the Kikuchi‐patterns, respectively on the indexing rates, have been scrutinized. Finally, the orientation obtained of each tested diamond sample has been utilized in a statistical design to show a direct influence of the crystal orientation on the wear behavior of the diamond grains.