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Use of X‐ray diffraction and micromagnetic methods for a complete characterization of residual stress states in manufactured parts
Author(s) -
Epp J.,
Hirsch T.,
de Souza Rosendo T.
Publication year - 2009
Publication title -
materialwissenschaft und werkstofftechnik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.285
H-Index - 38
eISSN - 1521-4052
pISSN - 0933-5137
DOI - 10.1002/mawe.200900472
Subject(s) - residual stress , diffraction , calibration , materials science , characterization (materials science) , residual , distortion (music) , x ray , stress (linguistics) , optics , composite material , physics , mathematics , optoelectronics , nanotechnology , algorithm , amplifier , linguistics , philosophy , cmos , quantum mechanics
As machining induced residual stress states are an important factor for the distortion of parts during following heat treatments, a complete characterization of the components residual stress state is required. For a gain of time, magnetic and micromagnetic analysis has been compared with X‐ray diffraction analysis. Cylindrical and tapered ball bearing rings made from AISI52100 steel with various and inhomogeneous residual stress states have been investigated. Reliable results and good agreement between X‐Ray diffraction data and residual stresses calculated form the magnetic and micromagnetic analysis can be obtained with the use of a calibration for each single component. An important gain of time can be achieved with the combined use of X‐ray diffraction analysis for the calibration and the micromagnetic technique. However, local variations of the residual stress may not be detected in localized zones smaller than the sensor. A global calibration with one calibration file for eight rings still needs some optimization.