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Eliminating the Extinction‐Induced Reflection Enlargement in the XRD Characterisations of Textured Films
Author(s) -
Tomov I.
Publication year - 2003
Publication title -
materialwissenschaft und werkstofftechnik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.285
H-Index - 38
eISSN - 1521-4052
pISSN - 0933-5137
DOI - 10.1002/mawe.200390138
Subject(s) - extinction (optical mineralogy) , ideal (ethics) , reflection (computer programming) , texture (cosmology) , reflectivity , materials science , optics , mathematics , physics , computer science , image (mathematics) , computer vision , philosophy , epistemology , programming language
This investigation throws additional light on the nature of secondary extinction (SE). A method is described for computing the correct integral breadth using the observed one, which is affected by SE. The method is applied for more precise measuring the integral breadths of reflections corresponding to the ideal directions of main texture components of electrodeposited silver films. Further, the effect of SE on the systematic error in integral breadth measurements is investigated in dependence on the reflectivity and pole density .