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Glass capillaries as primary optics for X‐ray stress analysis
Author(s) -
Gibmeier J.,
Scholtes B.
Publication year - 2003
Publication title -
materialwissenschaft und werkstofftechnik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.285
H-Index - 38
eISSN - 1521-4052
pISSN - 0933-5137
DOI - 10.1002/mawe.200390002
Subject(s) - pinhole (optics) , optics , materials science , optical glass , beam (structure) , intensity (physics) , stress (linguistics) , interference (communication) , surface finish , aperture (computer memory) , composite material , physics , acoustics , engineering , electrical engineering , linguistics , philosophy , channel (broadcasting)
For locally resolved X‐ray stress analysis the practical application of industrial glass capillaries was investigated. The capillaries were characterised with respect to their surface roughness and their deviation in alignment. X‐ray interference profiles were measured in order to evaluate the potential gain in primary intensity in comparison to measurements carried out by using conventional pinhole collimators. It can be concluded that industrial sodalime‐glass capillaries manufactured by the redraw‐process can be used as a suitable low‐cost alternative primary aperture in X‐ray stress analysis. For primary beam diameters ≤ Ø1.0 mm an immense gain of intensity was observed that increases with decreasing diameter of the aperture.