Premium
Computer simulations of atomic force microscopy: crystalline polymers and the effects of surface contaminants
Author(s) -
Sumpter Bobby G.,
Getino Coral,
Noid Donald W.,
Wunderlich Bernhard
Publication year - 1993
Publication title -
macromolecular theory and simulations
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.37
H-Index - 56
eISSN - 1521-3919
pISSN - 1022-1344
DOI - 10.1002/mats.1993.040020105
Subject(s) - atomic force microscopy , surface (topology) , polymer , contamination , materials science , nanotechnology , microscopy , chemical physics , chemistry , composite material , optics , physics , geometry , mathematics , ecology , biology
The atomistic dynamics of the interaction of an atomic force microscopic (AFM) probe with a crystalline polyethylene surface was examined by using the molecular dynamics method. The results show that the internal dynamics of the polymer crystal is such that rapid relaxation occurs, providing for a large amount of structural reversibility and making it possible to perform nondestructive AFM experiments. However, surface and/or AFM tip defects or contaminants (such as those which can be induced by polar molecules adsorbed on the surface), can result in significant perturbations in the AFM images produced, causing large and sharp structures to appear on the surface topology. A rationale of the mechanisms responsible for the image distortions is presented, and a relationship to defects observed in AFM and STM experiments is given.