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The Combination of Electron Microscopy, Raman Microscopy and Energy Dispersive X‐Ray Spectroscopy for the Investigation of Polymeric Materials
Author(s) -
Schmidt Ruth,
Fitzek Harald,
Nachtnebel Manfred,
Mayrhofer Claudia,
Schroettner Hartmuth,
Zankel Armin
Publication year - 2019
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.201800237
Subject(s) - raman spectroscopy , scanning electron microscope , materials science , microscopy , acceleration voltage , polymer , nanotechnology , characterization (materials science) , energy dispersive x ray spectroscopy , analytical chemistry (journal) , optics , composite material , electron , cathode ray , chemistry , physics , organic chemistry , quantum mechanics
Polymers play an important role in materials science, because of their advantages over other types of materials. The huge variety in terms of the types, arrangements and combinations of monomers found in polymers leads to an extremely wide diversity of different polymeric materials. Although there is a wide range of analytical techniques to characterize polymeric materials, here the focus is laid on a novel correlative microscopy method, combining Raman microscopy, scanning electron microscopy (SEM) and energy dispersive X‐ray spectroscopy (EDXS). Therefore, three polymeric specimens were analysed by the new system RISE (Raman Imaging and Scanning Electron microscopy) in combination with EDXS. The aim of this contribution is to demonstrate the potential of the new system to characterize different polymeric layers, as well as fillers and additives in polymeric materials. In addition to the results, a methodical chapter deals with preparation aspects, investigation skills and imaging modes of the electron microscope. Here the so‐called variable pressure mode (VP) is mentioned, where nitrogen is used as imaging gas at pressures between 10 and 133 Pa. Furthermore, the low‐voltage mode in the high vacuum is discussed which gives a better surface resolution due to a smaller interaction volume of the electrons in the material and furthermore causes lower beam damage. Both modes work without a conductive coating on the specimen, which is a requirement for Raman investigations. Further capabilities of the RISE system in combination with the EDXS will be discussed afterwards.