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Dielectric Properties of γ‐Iirradiated, Stretched, and Poled PVDF Thin Films
Author(s) -
Madivalappa Shivaraj,
Jali Vivekanand M.,
Jain Anjana
Publication year - 2019
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.201800178
Subject(s) - materials science , polyvinylidene fluoride , dielectric , dielectric loss , irradiation , composite material , thin film , loss factor , phase (matter) , polymer , optoelectronics , nanotechnology , chemistry , physics , organic chemistry , nuclear physics
The effects of γ‐irradiation on the dielectric properties of stretched and poled polyvinylidene fluoride thin films synthesized by solvent cast method are reported. The films are subjected to γ‐irradiation with different doses (25, 50, and 75 kGy). XRD pattern is obtained to identify the presence of α/β phases. Dielectric constant and loss values of the stretched and poled films have been measured, before and after irradiation, and their nature of variation has been studied. β phase is retained even after the irradiation thereby confirming that the radiation damage is not significant. The dielectric loss is minimum in the frequency range 10 2 to10 4 Hz, giving the preferable frequency range of operation for devices