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Fluorinated Polyurethanes: XPS and AFM Characterization
Author(s) -
Penoff M.,
Schreiner W.,
Oyanguren P.,
Montemartini P.
Publication year - 2012
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.201251133
Subject(s) - x ray photoelectron spectroscopy , cyclohexane , polyurethane , atomic force microscopy , materials science , oxide , polyethylene , polyethylene oxide , fluorine , contact angle , polymer chemistry , characterization (materials science) , chemical engineering , chemistry , nanotechnology , organic chemistry , polymer , composite material , engineering , metallurgy
Summary: Fluorinated polyurethane films were obtained from 5‐isocyanato‐1‐(isocyanatomethyl)‐1,3,3‐trimethyl‐cyclohexane (IPDI) and polyethylene oxide (PEO), employing two monoalcohols with different chain lenghts as fluorinated modifiers, 1H,1H,2H,2H‐tridecafluoro‐1‐n‐octanol (EA600) and 1H,1H,2H,2H‐heptadecafluoro‐1‐n‐decanol (EA800). X‐ray photoelectron spectroscopy (XPS) has demonstrated that fluorine surface enrichment takes place. Atomic force microscopy (AFM) was employed in order to characterize films surfaces, in terms of topography and differences in hydrophobicity from light and moderate tapping conditions.