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High‐Resolution Tip‐Enhanced Raman Mapping
Author(s) -
Hoffmann G. G.,
Xue L.,
Loos J.,
de With G.
Publication year - 2011
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.201000138
Subject(s) - raman spectroscopy , materials science , resolution (logic) , carbon nanotube , graphene , image resolution , phase (matter) , polymer , analytical chemistry (journal) , nanotechnology , optoelectronics , optics , composite material , chemistry , chromatography , physics , organic chemistry , artificial intelligence , computer science
Tip‐enhanced Raman mapping (TERM) can be used to obtain chemical analysis of a sample with a topographical resolution down to 15 nm. A short review of this technique is given. Among other samples (e.g. carbon nanotubes and graphene), we recently measured a high resolution tip‐enhanced Raman map of a polymer for the first time. Using TERM, the phase separation behaviour of a polymer blend (PMMA/SAN) was monitored. In the early, incomplete state of phase separation an interface width of ∼200 nm was measured. A spatial resolution in the tens of nm range could be achieved.
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