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High Resolution Tip Enhanced Raman Mapping on Polymer Thin Films
Author(s) -
Xue L.,
Li W.,
Hoffmann G. G.,
Goossens J. G. P.,
Loos J.,
de With G.
Publication year - 2011
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.201000132
Subject(s) - materials science , raman spectroscopy , methyl methacrylate , annealing (glass) , glass transition , thin film , polymer , styrene , nanoscopic scale , chemical engineering , copolymer , high resolution , phase (matter) , composite material , polymer chemistry , nanotechnology , optics , organic chemistry , chemistry , physics , remote sensing , engineering , geology
Advanced tip enhanced Raman mapping (TERM) was applied to high resolution chemical identification on nanoscale. Thin poly(methyl methacrylate)/poly(styrene acrylonitrile) (SAN28/PMMA) blend films were measured at different stages of phase separation. New insights into the phase evolution behavior of the thin films were obtained, when the TERM images were compared. An unexpected morphology transition was observed after a few minutes annealing at 250 °C. No surface enrichment of PMMA was observed, differing from the previous reports on a similar well‐studied system of SAN33/PMMA. The glass transition temperature, the surface and interfacial tension were found to be the main factors responsible for the phase evolution behavior of SAN28/PMMA films.