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Total Internal Reflection Ellipsometry under SPR Conditions: In‐Situ Monitoring of the Growth of Poly( N ‐isopropylacrylamide) (PNIPAAm) Brushes
Author(s) -
Erber Michael,
Stadermann Jan,
Eichhorn Klaus Jochen
Publication year - 2011
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.201000126
Subject(s) - ellipsometry , poly(n isopropylacrylamide) , materials science , surface plasmon resonance , opacity , characterization (materials science) , total internal reflection , in situ , reflection (computer programming) , chemical engineering , optics , nanotechnology , optoelectronics , chemistry , thin film , polymer , nanoparticle , composite material , copolymer , physics , computer science , programming language , engineering , organic chemistry
Total internal reflection ellipsometry (TIRE) under surface plasmon resonance (SPR) conditions represents a powerful characterization technique combining the conveniences of spectroscopic ellipsometry with SPR. Besides the very high sensitivity to small changes in the optical constants (up to 10 times more sensitive than conventional ellipsometry), the possibility to investigate media of different optical densities or even opaque media makes this analytical method very convenient for different sensing applications. This article presents an example of application of TIRE under SPR conditions for the continuously in‐situ monitoring of the growth of covalently tethered poly( N ‐isopropylacrylamide) (PNIPAAm) chains on a gold surface.