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An Electric Criterion to Evaluate Glass Transition Temperature: Dielectric Relaxation Measurements
Author(s) -
D'Angelo P.,
Barra M.,
Cassinese A.,
Guido S.,
Tomaiuolo G.
Publication year - 2007
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.200750106
Subject(s) - differential scanning calorimetry , dielectric , glass transition , materials science , relaxation (psychology) , phase transition , polydimethylsiloxane , work (physics) , sensitivity (control systems) , thermodynamics , condensed matter physics , composite material , polymer , optoelectronics , electronic engineering , physics , psychology , social psychology , engineering
In this contribution, a dielectric measurement technique for the evaluation of phase transition temperature and the study of physical aging on polymeric thin films is considered. This kind of measurement provides the possibility of displaying phase transitions with a high degree of precision. Furthermore, it can be considered alternatively to techniques not applicable in the case of thin films, such as Differential Scanning Calorimetry (DSC). In this work, owing to the high sensitivity of the utilized experimental set‐up, a glass transition T G of 156 K, with a precision equal to 0.3%, and a melting T M = 220 K have been assessed for 4 µm thick Polydimethylsiloxane (PDMS) films. Performing measurement as a function of time, it was possible to monitor physical aging phenomena, mainly consisting in a change of dielectric properties. As expected, the time evolution of the aging phenomena can be described by a simple logarithmic law.