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Experimental Testing of Lateral and Depth Resolution in Imaging Methods
Author(s) -
Wilhelm Peter,
Chernev Boril,
Pölt Peter
Publication year - 2005
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.200551148
Subject(s) - environmental scanning electron microscope , raman spectroscopy , materials science , resolution (logic) , radiation damage , polymer , cathode ray , optics , composite material , radiation , scanning electron microscope , electron , computer science , physics , quantum mechanics , artificial intelligence
A polymer laminate and a PA‐PTFE blend were studied by various imaging methods (FT‐IR, Raman, ESEM). Different lateral and depth resolution of the methods were used to gain complementary information on the structure of the materials. Radiation damage caused by the electron beam during ESEM investigation was studied by Raman global imaging.