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Depth profiling of polymer films by confocal Raman spectroscopy
Author(s) -
Spells Stephen J.,
Reinecke Helmut,
Sacristán Javier,
Yarwood Jack,
Mijangos Carmen
Publication year - 2003
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.200351313
Subject(s) - raman spectroscopy , confocal , polymer , raman microspectroscopy , materials science , solvent , refractive index , analytical chemistry (journal) , raman scattering , chemical engineering , optics , chemistry , chromatography , composite material , optoelectronics , organic chemistry , physics , engineering
Confocal Raman microspectroscopy has many potential applications in the study of polymer‐solvent interactions, including the determination of solvent and polymer‐solvent complex depth profiles. This contribution focuses on preventing the formation of polymer‐solvent complexes, using surface chemical modification of PVC films. While the surface‐specific nature of the film modification is easily demonstrated, [1] confocal Raman measurements clearly show the effects of film refractive index: the modifier depth profile shows a lack of symmetry and the film thickness is underestimated. A spectral normalisation method is described, and this is shown to result in a modifier depth profile which is in good agreement with data obtained by Raman microspectroscopy following physical cross‐sectioning of a sample. Alternative techniques for Raman depth profiling are also discussed.