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Scanning force microscopy experiments probing micromechanical properties on polymer surfaces using harmonically modulated friction techniques II. Investigations of heterogeneous systems
Author(s) -
Sturm Heinz,
Schulz Eckhard,
Munz Martin
Publication year - 1999
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.19991470125
Subject(s) - materials science , polypropylene , acrylonitrile butadiene styrene , polymer , composite material , scanning force microscopy , surface finish , microscopy , surface roughness , atomic force microscopy , scanning probe microscopy , polymer blend , polybutadiene , force spectroscopy , nanotechnology , optics , copolymer , physics
Applying a high‐frequency lateral vibration between tip and sample in a scanning force microscope (SFM), a harmonically modulated lateral (friction) force image can be obtained using lock‐in techniques. Harmonically modulated lateral force microscopy (HM‐LFM) offers several advantages compared with standard lateral force microscopy (LFM). After a brief investigation of the scan velocity dependence of LFM and HM‐LFM, two samples were investigated. First, the surface of a poly(acrylonitrile‐ co ‐styrene)/polybutadiene blend (ABS) was used to demonstrate the ability of the new technique to decrease the stick effects of the SFM tip. Second, an interface between two chemically very similar polymers was prepared by melting polypropylene (PP) and poly(propene‐ block ‐ethene) (PP‐ block ‐PE) films on each other. After cutting, the surface roughness of this sample was very high. It is shown that only HM‐LFM clearly resolves the local micromechanical properties without artefacts.