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Surface microstructure of carbon black: Advances in characterization by scanning tunneling microscopy
Author(s) -
Donnet JeanBaptiste,
Wang Tong Kuan
Publication year - 1996
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.19961080109
Subject(s) - scanning tunneling microscope , characterization (materials science) , materials science , stacking , microstructure , crystallinity , nanoscopic scale , carbon black , nanotechnology , surface finish , surface roughness , carbon fibers , microscopy , scanning probe microscopy , chemical physics , optics , composite material , chemistry , composite number , physics , natural rubber , organic chemistry
The recent advances in the characterization of the surface structure of carbon black by scanning tunneling microscopy (STM) are reported. The atomic organization, at the surfaces of several carbon blacks, is well resolved by STM and a local paracrystalline structure model is proposed, where the distorted carbon layer and thus the unequal inter‐layer distance are evidenced on the basis of the classical turbostratic stacking. The quantitative analysis of the STM image, which enables a quantitative assessment of the surface crystallinity and of the nanoscale roughness, is presented.