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Surface analysis of polymer materials by secondary ion mass spectrometry
Author(s) -
Benninghoven Alfred,
Rading Derk
Publication year - 1994
Publication title -
macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 1022-1360
DOI - 10.1002/masy.19940830106
Subject(s) - secondary ion mass spectrometry , monolayer , polymer , static secondary ion mass spectrometry , mass spectrometry , ion , analytical chemistry (journal) , resolution (logic) , characterization (materials science) , oligomer , materials science , polymerization , chemistry , polymer chemistry , organic chemistry , chromatography , nanotechnology , composite material , artificial intelligence , computer science
Atomic as well as molecular secondary ions are emitted from the uppermost monolayer of a solid during ion bombardment. Mass analysis of these positive and negative secondary ions supplies detailed information on the chemical composition of the bombarded surface. High mass range (> 10,000 u), high mass resolution (m/Δm > 10,000), accurate mass determination (ppm range) and high sensitivity (ppm of a monolayer) are achieved by applying time‐of‐flight (TOF) mass analyzers. TOF‐SIMS has been successfully applied to a wide variety of polymer materials, including polymer blends, chemically or plasma modified surfaces, and plasma polymerization layers. Detailed information on the composition of repeat units, endgroups, oligomer distributions, additives, as well as surface contaminants can be obtained. Basic concepts of TOF‐SIMS will be described and typical analytical examples for the characterization of polymer materials will be presented.