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The determination of the lamellar thickness in semi‐crystalline polymers by small‐angle scattering
Author(s) -
Vonk C.G.
Publication year - 1988
Publication title -
makromolekulare chemie. macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 0258-0322
DOI - 10.1002/masy.19880150116
Subject(s) - lamellar structure , scattering , materials science , polymer , phase (matter) , small angle scattering , small angle x ray scattering , surface (topology) , optics , composite material , geometry , chemistry , physics , mathematics , organic chemistry
Three small‐angle scattering methods for determining the thickness of the crystalline lamellae in polymers are described. These are based on 1. observation of the identity period, 2. determination of the specific surface of the phase boundary, and 3. analysis of the shape of the peak at the origin. The conditions for application of these methods and the types of average obtained are discussed, and some results are presented.