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Time‐of‐flight small‐angle scattering spectrometers on pulsed neutron sources
Author(s) -
Ostanevich Yurii M.
Publication year - 1988
Publication title -
makromolekulare chemie. macromolecular symposia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.257
H-Index - 76
eISSN - 1521-3900
pISSN - 0258-0322
DOI - 10.1002/masy.19880150107
Subject(s) - spectrometer , time of flight , neutron scattering , neutron , normalization (sociology) , small angle neutron scattering , physics , scattering , neutron time of flight scattering , optics , nuclear physics , neutron source , computational physics , materials science , sociology , anthropology
Abstract The operation principles, constructions, advantages and shortcomings of the known Time‐of‐Flight Small‐Angle Neutron Scattering (TOF SANS) spectrometers built up on pulsed neutron sources are reviewed. The most important characteristics of TOF SANS apparatuses are rather a high luminosity and the possibility of measurement in an extremely wide range of the scattering vector at a single exposure. This is achieved by simultaneous employment of the white beam, TOF technique for Λ‐scan and the commonly known θ‐scan. However, the electronic equipment, data‐matching programs and the measurement procedure, necessary for accurate normalization of experimental data and their transformation into absolute cross‐section scale ‐ they all become more complex as compared with those for SANS apparatuses operating on steady‐state neutron sources, where only θ ‐scan is used.