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Direct Correlation Between Electric and Structural Properties During Solidification of Poly(3‐hexylthiophene) Drop‐Cast Films
Author(s) -
Grodd Linda,
Pietsch Ullrich,
Grigorian Souren
Publication year - 2012
Publication title -
macromolecular rapid communications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.348
H-Index - 154
eISSN - 1521-3927
pISSN - 1022-1336
DOI - 10.1002/marc.201200309
Subject(s) - crystallinity , materials science , crystallite , electric field , diffraction , drop (telecommunication) , polymer , evaporation , composite material , optics , thermodynamics , metallurgy , electrical engineering , physics , quantum mechanics , engineering
Abstract Structural and electrical properties of semicrystalline P3HT cast films onto Si/SiO 2 surface are studied during the solidification under applied electric field in lateral OFET geometry. During evaporation of the solvent, the formation of P3HT crystallites is monitored simultaneously by time‐resolved X‐ray diffraction and by source‐drain current measurements. The electrical current is reaching its maximum in two pronounced regimes already before complete solidification of the polymer as detected by X‐ray diffraction intensities. The monitored complex time dependence of current and X‐ray intensities reveals a highest conducting level for the gel‐like state.