Premium
Microfocus X‐Ray Scattering Scanning Microscopy for Polymer Applications
Author(s) -
Zafeiropoulos Nikolaos E.,
Davies Richard J.,
Roth Stephan V.,
Burghammer Manfred,
Schneider Konrad,
Riekel Christian,
Stamm Manfred
Publication year - 2005
Publication title -
macromolecular rapid communications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.348
H-Index - 154
eISSN - 1521-3927
pISSN - 1022-1336
DOI - 10.1002/marc.200500428
Subject(s) - scattering , materials science , small angle x ray scattering , polymer , nanometre , synchrotron , synchrotron radiation , composite material , fracture (geology) , polyamide , microscopy , optics , physics
Summary: The fracture properties of polymers are one of the key parameters that define their service life and limit their applications. One of the most interesting and important questions is how the molecular architecture and the structure of polymers at nanolength scales influence their fracture properties. X‐ray scattering is a powerful means of probing bulk structures at the nanometre scale. It can therefore provide a wealth of information relating to such structure‐property relationships. In the present study, synchrotron radiation microfocus small‐angle X‐ray scattering is used to investigate the damage area ahead and around the crack tip in polyamide 6 (PA6). The results reveal that the damage area propagates far beyond the visible crack, and inside the damaged zone platelet‐shaped cracks/voids are formed.