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Atomic Force Microscopy as a Tool to Study the Distribution of Rubber in High Impact Poly(propylene) Particles
Author(s) -
Bouzid Djallel,
Gaboriaud Fabien,
McKenna Timothy F.
Publication year - 2005
Publication title -
macromolecular materials and engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 96
eISSN - 1439-2054
pISSN - 1438-7492
DOI - 10.1002/mame.200400248
Subject(s) - natural rubber , materials science , particle (ecology) , atomic force microscopy , composite material , tacticity , microscopy , nanotechnology , polymer , optics , physics , oceanography , polymerization , geology
Summary: Atomic force microscopy (AFM) was used as a tool to explore the nanomechanical properties of isotactic poly(propylene) (PP) homopolymer and of high impact poly(propylene) (hiPP) products with different rubber contents. It was shown that the interpretation of the approach curves (force vs. piezo displacement) allows one to identify the relative amounts of rubber at different spots within the particles. In addition, it was possible to differentiate between areas where the rubber layers were less than 10 nm thick, and those where there was more rubber. Comparison of the mechanical properties of PP and hiPP particles allowed us to propose a model for the distribution of rubber within the particles.Domains defined in the PP and hiPP particles (particle surface and section).