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Microscopic Characterization of Poly(Sulfur Nitride)
Author(s) -
Amado Elkin,
Hasan Nazmul,
Busse Karsten,
Kressler Jörg
Publication year - 2021
Publication title -
macromolecular chemistry and physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.57
H-Index - 112
eISSN - 1521-3935
pISSN - 1022-1352
DOI - 10.1002/macp.202170036
Subject(s) - ohmic contact , sulfur , characterization (materials science) , nitride , materials science , conductivity , electrical resistivity and conductivity , quantum tunnelling , front cover , atomic force microscopy , polymer chemistry , nanotechnology , composite material , chemical engineering , chemistry , optoelectronics , cover (algebra) , metallurgy , electrical engineering , mechanical engineering , layer (electronics) , engineering
Front Cover : In the article number 2100113, Jörg Kressler and co‐workers discuss the morphology of poly(sulfur nitride). In particular, the twinning of crystals has a strong influence on the electrical conductivity. The current–voltage curves as obtained in the AFM Peak Force tunneling mode show the typical ohmic behavior of metals.

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