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Confocal Raman Microspectroscopy: A Non‐Invasive Approach for in‐Depth Analyses of Polymer Substrates
Author(s) -
Tomba J. Pablo,
Pastor José M.
Publication year - 2009
Publication title -
macromolecular chemistry and physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.57
H-Index - 112
eISSN - 1521-3935
pISSN - 1022-1352
DOI - 10.1002/macp.200800582
Subject(s) - confocal , raman spectroscopy , raman microspectroscopy , polymer , optics , sample preparation , materials science , profiling (computer programming) , nanotechnology , analytical chemistry (journal) , chemistry , composite material , chromatography , computer science , physics , operating system
Abstract We present a simple approach that avoids the problem of coupling fluid‐sample interaction in confocal Raman depth‐profiling with immersion objectives. We use a thin protective medium (PE film) that preserves the sample from direct contact with the coupling fluid, and that can be readily attached/de‐attached from the sample surface by applying a small difference of pressure. The strategy was tested performing confocal Raman depth profiling studies on a series of transparent substrates (PP films; 25, 44 and 60 µm nominal thickness) and comparing the results with those obtained with conventional approaches. It is shown that the strategy recovers very well all the film features, preserving at the same time a good depth resolution and optical throughput.