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Ultra‐Small‐Angle X‐Ray Scattering Study of PET/PC Nanolayers and Comparison to AFM Results
Author(s) -
Ania Fernando,
PuenteOrench Inés,
Baltá Calleja Francisco J.,
Khariwala Devang,
Hiltner Anne,
Baer Eric,
Roth Stephan V.
Publication year - 2008
Publication title -
macromolecular chemistry and physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.57
H-Index - 112
eISSN - 1521-3935
pISSN - 1022-1352
DOI - 10.1002/macp.200700639
Subject(s) - small angle x ray scattering , scattering , materials science , nanostructure , crystallization , atomic force microscopy , polymer , layer (electronics) , crystallography , optics , nanotechnology , composite material , physics , chemistry , thermodynamics
The forced assembly of two immiscible polymers, produced by layer‐multiplying co‐extrusion, is analyzed by means of USAXS. Comparison of scattering and AFM results sheds light on many details of the nanolayered structure in PET/PC films. The role played by the volume concentration and cold crystallization of PET on the experimental scattering is discussed. The appearance of at least two scattering maxima in all cases, corresponding to higher orders of the same repeating distance, accounts for the high regularity of the developed nanostructure. It is finally shown that long spacing values, derived from a localized area in AFM, are in a good agreement with the USAXS values averaged over much larger areas.