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Dielectric Response of Aramid Fiber‐Reinforced PEEK
Author(s) -
Korbakov Nina,
Harel Hannah,
Feldman Yuri,
Marom Gad
Publication year - 2002
Publication title -
macromolecular chemistry and physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.57
H-Index - 112
eISSN - 1521-3935
pISSN - 1022-1352
DOI - 10.1002/macp.200290000
Subject(s) - peek , aramid , composite material , materials science , scanning electron microscope , fiber , dielectric , transverse plane , amorphous solid , polymer , chemistry , crystallography , structural engineering , optoelectronics , engineering
Dielectric spectroscopy was applied for the first time to aramid fiber‐reinforced PEEK, wherein the effect of the fiber on the dielectric response was examined for both amorphous and crystalline poly(ether ether ketone) (PEEK) over wide temperature and frequency ranges. Whereas the temperature behavior of the dielectric losses of the materials exhibited the typical α and β processes of PEEK, the specific effect of the fibers in the crystalline PEEK was revealed in shifting the α process to a higher temperature. The unique effect of the fibers was expressed by a significantly higher activation energy and lower dielectric strength for the α relaxation, reflecting a higher constraint level that is imposed by the fiber. It is proposed that this additional constraint is associated with fiber generated transcrystallinity.Scanning electron micrograph of transverse fracture surface of crystallized unidirectional aramid fiber‐reinforced PEEK.