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Characterization of recast Nafion films by small‐ and wide‐angle X‐ray scattering
Author(s) -
Halim John,
Scherer Günther G.,
Stamm Manfred
Publication year - 1994
Publication title -
macromolecular chemistry and physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.57
H-Index - 112
eISSN - 1521-3935
pISSN - 1022-1352
DOI - 10.1002/macp.1994.021951204
Subject(s) - small angle x ray scattering , nafion , materials science , polymer , scattering , curing (chemistry) , ionic bonding , relative humidity , polymer chemistry , chemical engineering , electrochemistry , composite material , chemistry , optics , organic chemistry , electrode , physics , thermodynamics , ion , engineering
Room temperature recast Nafion General formula: films, prepared under different humidities in the curing atmosphere, were characterized by small‐ and wide‐angle X‐ray scattering (SAXS and WAXS). SAXS reveals that the humidity influences the size of the ionic clusters in these polymer films. It was found that the number and size of ionic clusters increases with increasing relative humidity. WAXS indicates the presence of locally ordered regions of the backbone polymer. These results allow a qualitative understanding of the electrochemical behaviour of Nafion recast films cured at different humidities, as described in the literature.