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Materials and Corrosion 1/2013
Author(s) -
Collins M. N.,
Reid M.,
Dalton E.,
Shan K.,
GarfiasMesias L. F.
Publication year - 2013
Publication title -
materials and corrosion
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 55
eISSN - 1521-4176
pISSN - 0947-5117
DOI - 10.1002/maco.201390000
Subject(s) - cable gland , corrosion , cover (algebra) , scanning electron microscope , materials science , metallurgy , atmosphere (unit) , telecommunications , physics , engineering , composite material , mechanical engineering , meteorology
Cover: Backscattered scanning electron microscopy cross sectional image of a Ni/NiPd/Au electronic connector after 10 days exposure to a Class III mixed flowing gas (MFG) corrosive atmosphere. This work was carried out at the Stokes Research Institute Laboratories, University of Limerick, Ireland with collaborators in Det Norske Veritas (U.S.A.), Inc and Southwest Research Institute, San Antonio, TX, USA. Further details on the performance of various connector coatings can be found in: M. N. Collins, M. Reid, E. Dalton, K. Shannon, L. F. Garfias‐Mesias , Mixed flowing gas (MFG) corrosion of various connector coatings, Materials and Corrosion  2013 , 64 , 7 .

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