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Characterization of corrosion products on chalcographic copper plates after 200 years' exposure to indoor atmospheres
Author(s) -
Otero E.,
Bastidas J. M.,
López W.,
Fierro J. L. G.
Publication year - 1994
Publication title -
materials and corrosion
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 55
eISSN - 1521-4176
pISSN - 0947-5117
DOI - 10.1002/maco.19940450704
Subject(s) - cuprite , malachite , tarnish , x ray photoelectron spectroscopy , copper , auger electron spectroscopy , lacquer , microanalysis , spectroscopy , nuclear chemistry , corrosion , metallurgy , materials science , chemistry , analytical chemistry (journal) , chemical engineering , composite material , environmental chemistry , coating , physics , organic chemistry , quantum mechanics , nuclear physics , engineering
This work studies the characterization of corrosion products formed on six eighteenth century chalcographic copper plates preserved in the National Chalcography Collection in the San Fernando Royal Academy of Fine Arts in Madrid. The experimental methods used were X‐ray diffraction analysis (XRDA), Infrared spectroscopy (IRS), Auger electron spectroscopy (AES) and X‐ray photoelectron spectroscopy (XPS). The main compounds found were malachite CuCO 3 · Cu(OH) 2 , atacamite CuCl 2 · 3Cu(OH) 2 , nantokite CuCl, tenorite CuO, and cuprite Cu 2 O. Cuprite is the main compound found on the smooth areas of chalcographic plates, forming tarnish films. The thickness of the tarnish films is approximately 10–15 Å.