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Observation of a Topological Edge State in the X‐ray Band
Author(s) -
Huang Qiushi,
Guo Zhiwei,
Feng Jiangtao,
Yu Changyang,
Jiang Haitao,
Zhang Zhong,
Wang Zhanshan,
Chen Hong
Publication year - 2019
Publication title -
laser and photonics reviews
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.778
H-Index - 116
eISSN - 1863-8899
pISSN - 1863-8880
DOI - 10.1002/lpor.201800339
Subject(s) - photonics , physics , topology (electrical circuits) , robustness (evolution) , quantum optics , optics , enhanced data rates for gsm evolution , photonic crystal , computer science , mathematics , telecommunications , chemistry , biochemistry , combinatorics , gene
The possibility of obtaining edge states of light that are robust against disorder by mimicking the topological properties of a solid‐state system has brought a profound impact on optical sciences. In the short‐wavelength region, X‐ray science and technology is undergoing tremendous development. It requires high‐precision optics with exquisite control of light properties and robustness against structural perturbations. Therefore, it is very attractive to extend the concept of optical topological manipulation to the X‐ray regime. Herein, the topological edge state is theoretically proposed and experimentally demonstrated at the interface of two kinds of photonic crystals having different bandgap topological characteristics in the X‐ray regime. Remarkably, this topologically protected edge state is immune to the thickness disorder as long as the zero‐average‐effective‐mass condition is satisfied. This work extends the topological photonics to the X‐ray regime and paves the way for the development of novel X‐ray optics such as high‐resolution X‐ray filters/monochromators, or X‐ray quantum optics, to realize the phenomena such as Rabi splitting that are robust against disorders.