Premium
Plasmonic refraction‐induced ultrahigh transparency of highly conducting metallic networks
Author(s) -
Li Ruopeng,
Peng Qiang,
Han Bing,
Ke Yuanyu,
Wang Xin,
Lu Xubing,
Wu Xueyuan,
Kong Jiantao,
Ren Zhifeng,
Akinoglu Eser Metin,
Giersig Michael,
Zhou Guofu,
Liu JunMing,
Kempa Krzysztof,
Gao Jinwei
Publication year - 2016
Publication title -
laser and photonics reviews
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.778
H-Index - 116
eISSN - 1863-8899
pISSN - 1863-8880
DOI - 10.1002/lpor.201500271
Subject(s) - plasmon , figure of merit , materials science , transparency (behavior) , optoelectronics , electrical conductor , nanowire , optical transparency , electromagnetically induced transparency , optics , surface plasmon , metamaterial , nanotechnology , computer science , physics , computer security , composite material
We demonstrate a high optoelectronic performance and application potential of our random network, with subwavelength diameter, ultralong, and high‐quality silver nanowires, stabilized on a substrate with a UV binder. Our networks show very good optoelectronic properties, with the single best figure of merit of ∼1686, and excellent stability under harsh mechanical strain, as well as thermal, and chemical challenge. Our network transparency strongly exceeds the simple shading limit. We show that this transmission enhancement is due to plasmonic refraction , which in an effective medium picture involves localized plasmons, and identify the inhomogeneous broadening as the key factor in promoting this mechanism. Such networks could become a basis for a next generation of ultrahigh‐performance transparent conductors.