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Nano‐imaging through tip‐enhanced Raman spectroscopy: Stepping beyond the classical limits
Author(s) -
Verma P.,
Ichimura T.,
Yano T.,
Saito Y.,
Kawata S.
Publication year - 2010
Publication title -
laser and photonics reviews
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.778
H-Index - 116
eISSN - 1863-8899
pISSN - 1863-8880
DOI - 10.1002/lpor.200910039
Subject(s) - raman spectroscopy , optics , image resolution , diffraction , plasmon , materials science , resolution (logic) , spectroscopy , optical phenomena , wavelength , near field optics , optoelectronics , nanotechnology , physics , optical microscope , scanning electron microscope , quantum mechanics , artificial intelligence , computer science
The spatial resolution in optical imaging is restricted by so‐called diffraction limit, which prevents it to be better than about half of the wavelength of the probing light. Tip‐enhanced Raman spectroscopy (TERS), which is based on the SPP‐induced plasmonic enhancement and confinement of light near a metallic nanostructure, can however, overcome this barrier and produce optical images far beyond the diffraction limit. Here in this article, the basic phenomenon involved in TERS is reviewed, and the high spatial resolution achieved in optical imaging through this technique is discussed. Further, it is shown that when TERS is combined with some other physical phenomena, the spatial resolution can be dramatically improved. Particularly, by including tip‐applied extremely localized pressure in TERS process, it has been demonstrated that a spatial resolution as high as 4 nm could be achieved.