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Total value management — a knowledge management concept for integrating TQM into concurrent product and process development
Author(s) -
Prasad Biren
Publication year - 2001
Publication title -
knowledge and process management
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.341
H-Index - 44
eISSN - 1099-1441
pISSN - 1092-4604
DOI - 10.1002/kpm.112
Subject(s) - total quality management , process management , implementation , competitor analysis , new product development , computer science , product (mathematics) , process (computing) , exploit , concurrent engineering , quality (philosophy) , business , competition (biology) , concurrency , value (mathematics) , quality function deployment , knowledge management , operations management , marketing , engineering , software engineering , service (business) , computer security , scheduling (production processes) , ecology , philosophy , geometry , mathematics , epistemology , machine learning , biology , operating system
Most industrial implementations of total quality management (TQM) are based on dimensions , which are ‘quality‐oriented’, goals are ‘quality‐focused’ or efforts are ‘quality‐driven’. Today manufacturing sectors are much more fiercely competitive and global than before. Consumers are more demanding, competition is more contentious and ruthless, and technology is advancing (and changing) rapidly. The quality‐based philosophy inherent in a TQM implementation does not exploit the concurrencies present in today's complex product design, development and delivery (PD 3 ) environment. The competitors are always finding better and faster ways of designing and developing products. With the TQM process alone, it is difficult to accomplish all aspects of Total Value Management (TVM) such as X‐ability, cost, leanness, responsiveness, agility, tools and technology, and organization issues. A new concurrent Knowledge Management process for Total Value Management is proposed here, which accounts for concurrency — paralleling of value characteristics — along with an integrated methodology for their systematic deployment. Copyright © 2001 John Wiley & Sons, Ltd.

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