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Comparative TOF‐SIMS and MALDI TOF‐MS analysis on different chromatographic planar substrates
Author(s) -
Talian Ivan,
Orinák Andrej,
Preisler Jan,
Heile Andreas,
Onofrejová Lucie,
Kaniansky Dušan,
Arlinghaus Heinrich F.
Publication year - 2007
Publication title -
journal of separation science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.72
H-Index - 102
eISSN - 1615-9314
pISSN - 1615-9306
DOI - 10.1002/jssc.200700120
Subject(s) - chemistry , chromatography , mass spectrometry , analytical chemistry (journal) , analyte , silica gel , matrix assisted laser desorption/ionization , desorption , adsorption , organic chemistry
A comparison is made between two high resolution, surface‐based, mass spectrometric methods: time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) and matrix‐assisted laser desorption/ionisation mass spectrometry (MALDI TOF‐MS) in indication of abietic and gibberellic acids molecular profiles on different chromatographic thin layers. The analytes were applied to silica gel chromatographic thin layers with SIMS on‐line interfacing channel, monolithic silica gel ultra‐thin layers, and thin layers specifically designed for direct Raman spectroscopic analysis. Two MALDI matrices were used in this research: ferulic acid and 2,5‐dihydroxybenzoic acid. The silica gel SIMS‐interfacing channel strongly supported formation of numerous different MALDI MS fragments with abietic and gibberellic acids, and ferulic acid matrix. The most intense fragments belonged to [M–OH] + and [M] + ions from ferulic acid. Intense conjugates were detected with gibberellic acid. The MALDI MS spectrum from the monolithic silica gel surface showed very low analyte signal intensity and it was not possible to obtain MALDI spectra from a Raman spectroscopy treated chromatographic layer. The MALDI TOF MS gibberellic acid fragmentation profile was shielded by the matrix used and was accompanied by poor analyte identification. The most useful TOF‐SIMS analytical signal response was obtained from analytes separated on monolithic silica gel and a SIMS‐interfacing modified silica gel surface. New horizons with nanostructured surfaces call for high resolution MS methods (which cannot readily be miniaturised like many optical and electrochemical methods) to be integrated in chip and nanoscale detection systems.