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Lifetime prediction model of electrophoretic display based on high temperature and high humidity test
Author(s) -
Wu Mi,
Luo Yujie,
Wu Fenfang,
Chen Yu,
Wang Xidu,
Zeng Xi
Publication year - 2020
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1002/jsid.869
Subject(s) - humidity , arrhenius equation , acceleration , materials science , accelerated life testing , computer science , thermodynamics , statistics , weibull distribution , chemistry , physics , mathematics , activation energy , classical mechanics , organic chemistry
This paper studied the failure model of electrophoretic display (EPD) under different temperature and humidity conditions. With nine high temperature and high humidity tests, it verified that the Arrhenius accelerated lifetime model and the Peck accelerated lifetime model were not suitable for the lifetime prediction of EPD. Therefore, based on these two accelerated life models, this article proposed a new acceleration lifetime model, the Luo, Wu and Wu (LWW) model, which was more suitable for EPDs.