Assessment of wheat grain texture by near infrared reflectance measurements on bühler‐milled flour | Zendy

Osborne Brian G. | Zendy; Douglas Stuart | Zendy; Fearn Thomas | Zendy

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Assessment of wheat grain texture by near infrared reflectance measurements on bühler‐milled flour

Author(s) -

Osborne Brian G.,

Douglas Stuart,

Fearn Thomas

Publication year - 1981

Publication title -

journal of the science of food and agriculture

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.782

H-Index - 142

eISSN - 1097-0010

pISSN - 0022-5142

DOI - 10.1002/jsfa.2740320217

Subject(s) - calibration , standard deviation , texture (cosmology) , residual , analytical chemistry (journal) , standard error , mathematics , reflectivity , materials science , calibration curve , near infrared spectroscopy , mineralogy , chemistry , optics , statistics , chromatography , physics , detection limit , algorithm , artificial intelligence , computer science , image (mathematics)

A calibration is presented between near infrared (n.i.r.) reflectance data at 1720 and 1288 nm and wheat grain kernel texture as determined by air‐jet sieving on flour Bühler‐milled from home‐grown wheat. A multiple correlation of 0.996 and a residual standard deviation of 0.140 was achieved with a calibration set of 40 samples and the result was verified by prediction of values of further samples. The calibration was valid over two successive harvests (1978 and 1979) A separate calibration was obtained using a Neotec 101 instrument using data around 2230 nm when a multiple correlation of 0.974 and residual standard deviation of 0.32 was obtained. A calibration equation and pulse point are presented.

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