Raman spectroscopy with simultaneous measurement of two orthogonally polarized Raman spectra | Zendy

Thomson G. A. | Zendy; Baldwin K. J. | Zendy; Batchelder D. N. | Zendy

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Raman spectroscopy with simultaneous measurement of two orthogonally polarized Raman spectra

Author(s) -

Thomson G. A.,

Baldwin K. J.,

Batchelder D. N.

Publication year - 2003

Publication title -

journal of raman spectroscopy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.748

H-Index - 110

eISSN - 1097-4555

pISSN - 0377-0486

DOI - 10.1002/jrs.991

Subject(s) - raman spectroscopy , coherent anti stokes raman spectroscopy , laser , wafer , polarization (electrochemistry) , silicon , optics , analytical chemistry (journal) , raman microscope , spectral line , chemistry , microscope , materials science , raman scattering , optoelectronics , physics , chromatography , astronomy

A Raman microscope was modified to allow the independent acquisition of two orthogonally polarized components of a Raman spectrum in a single measurement. Preliminary performance was demonstrated by simultaneously measuring the intensity of both polarized components of the silicon Raman band at 520 cm −1 as a silicon wafer was rotated through 360° under a polarized laser Raman probe. Polarization‐resolved Raman spectra of a complex molecular crystal are also presented, illustrating the increase in spectral information available with the modified system. Copyright © 2003 John Wiley & Sons, Ltd.

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