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Raman spectroscopy with simultaneous measurement of two orthogonally polarized Raman spectra
Author(s) -
Thomson G. A.,
Baldwin K. J.,
Batchelder D. N.
Publication year - 2003
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.991
Subject(s) - raman spectroscopy , coherent anti stokes raman spectroscopy , laser , wafer , polarization (electrochemistry) , silicon , optics , analytical chemistry (journal) , raman microscope , spectral line , chemistry , microscope , materials science , raman scattering , optoelectronics , physics , chromatography , astronomy
A Raman microscope was modified to allow the independent acquisition of two orthogonally polarized components of a Raman spectrum in a single measurement. Preliminary performance was demonstrated by simultaneously measuring the intensity of both polarized components of the silicon Raman band at 520 cm −1 as a silicon wafer was rotated through 360° under a polarized laser Raman probe. Polarization‐resolved Raman spectra of a complex molecular crystal are also presented, illustrating the increase in spectral information available with the modified system. Copyright © 2003 John Wiley & Sons, Ltd.