Micromechanical analysis of silicon nitride: a comparative study by fracture mechanics and Raman microprobe spectroscopy | Zendy

Tochino Shigemi | Zendy; Pezzotti Giuseppe | Zendy

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Micromechanical analysis of silicon nitride: a comparative study by fracture mechanics and Raman microprobe spectroscopy

Author(s) -

Tochino Shigemi,

Pezzotti Giuseppe

Publication year - 2002

Publication title -

journal of raman spectroscopy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.748

H-Index - 110

eISSN - 1097-4555

pISSN - 0377-0486

DOI - 10.1002/jrs.901

Subject(s) - microprobe , raman spectroscopy , silicon nitride , micromechanics , materials science , fracture (geology) , composite material , ceramic , displacement (psychology) , fracture mechanics , silicon , analytical chemistry (journal) , forensic engineering , mineralogy , metallurgy , chemistry , optics , physics , engineering , psychology , chromatography , composite number , psychotherapist

Raman microprobe spectroscopy was used to characterize in situ microstress fields which develop during fracture of a toughened silicon nitride (Si 3 N 4 ) polycrystal. Maps of microscopic stress were collected in the neighborhood of a propagating crack both at zero and at critical loading conditions. Micromechanics results by Raman spectroscopy were analyzed and compared with conventional fracture mechanics assessments, such as the evaluation of rising R ‐curve behavior and crack opening displacement. Outcomes of these assessments illustrate that, despite the approximations involved in the piezo‐spectroscopic equations used for calculating the microstress field from a local Raman shift, Raman microprobe spectroscopy is a viable method for semi‐quantitative investigations of microfracture mechanisms in advanced ceramic materials. Copyright © 2002 John Wiley & Sons, Ltd.

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