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A Raman study of the lithium insertion process in vanadium pentoxide thin films deposited by atomic layer deposition
Author(s) -
BaddourHadjean R.,
Golabkan V.,
PereiraRamos J. P.,
Mantoux A.,
Lincot D.
Publication year - 2002
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.893
Subject(s) - raman spectroscopy , atomic layer deposition , crystallinity , pentoxide , thin film , vanadium , lithium (medication) , analytical chemistry (journal) , materials science , chemistry , layer (electronics) , electrochemistry , electrode , chemical engineering , inorganic chemistry , nanotechnology , crystallography , optics , endocrinology , medicine , physics , engineering , chromatography
Micro‐Raman spectrometry was applied to the characterization of the Li x V 2 O 5 phases (0 ≤ x ≤ 1.8) electrochemically produced from V 2 O 5 thin films prepared by atomic layer deposition (ALD). An electrochemical study showed that V 2 O 5 ALD films constitute attractive positive electrodes for rechargeable lithium microbatteries. The good homogeneity and crystallinity of the films allowed us to obtain high‐resolution Raman spectra and to follow their transformation as lithium insertion proceeds. Specific Raman fingerprints were obtained for the successive α, ε, δ and γ phases, and structural reversibility was evidenced for lithium uptake >1. Copyright © 2002 John Wiley & Sons, Ltd.