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Raman spectroscopic investigation of zircon in gem‐quality sapphire: Application in origin determination
Author(s) -
Xu Wenxing,
Krzemnicki Michael S.
Publication year - 2021
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.6092
Subject(s) - zircon , orogeny , raman spectroscopy , geology , sri lanka , sapphire , full width at half maximum , geochemistry , metamorphic rock , mineralogy , materials science , paleontology , south asia , physics , optics , optoelectronics , laser , ethnology , history , tectonics
In this study, zircon inclusions in selected 115 unheated sapphires originating from metamorphic deposits were studied by confocal micro‐Raman spectroscopy. By comparing Raman features of zircon inclusions in gem‐quality sapphires from Myanmar, India (Kashmir), Sri Lanka, and Madagascar, it could be established that those of younger age (sapphires from Myanmar and India [Kashmir]) contain zircon inclusion which exhibit relatively low ʋ 1 and ʋ 3 band positions and also smaller FWHM (ʋ 3 ) than those in the older sapphires from Sri Lanka and Madagascar. Binary plotting of ʋ 1 versus ʋ 3 frequencies (Figure 3) and ʋ 3 wavenumber versus FWHM of the studied zircon inclusions provide a method to distinguish young sapphires formed during Alpine‐Himalayan orogeny (Kashmir, Myanmar) from those related to the Pan‐African orogeny (Sri Lanka, Madagascar). This study shows the potential of the non‐destructive method on zircon inclusions in sapphires to be used to distinguish their origin as a service to the commercial gem trade.