Premium
Characterization of two‐dimensional materials from Raman spectral data
Author(s) -
Mishra Preet,
Narayan Tripathi Laxmi
Publication year - 2020
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.5744
Subject(s) - raman spectroscopy , materials science , photon , characterization (materials science) , graphene , monolayer , python (programming language) , photovoltaics , band gap , optoelectronics , nanotechnology , optics , photovoltaic system , physics , computer science , ecology , biology , operating system
Two‐dimensional materials like graphene and transition metal dichalcogenides materials such as WS 2 and MoS 2 are an attractive material platform for optoelectronics devices, photovoltaics, and strain‐induced deterministic single‐photon sources due to high carrier mobility, tunable band gap, and ease of transfer on the desired substrates. In many of these applications, knowing the number of layers is important; for example, only strained monolayer of WSe 2 emits single photons at 4.5 K. Here, we present an analytical tool based on open‐source Python modules to determine the number of layers (accurately, up to five layers) by analyzing Raman spectral data. Using the data from spatially resolved Raman measurements on a two‐dimensional material and this tool, the sample morphology in terms of a number of layers can be preliminarily determined.