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Submicron Raman spectroscopy mapping of serpentinite fault rocks
Author(s) -
Rooney Jeremy S.,
Tarling Matthew S.,
Smith Steven A.F.,
Gordon Keith C.
Publication year - 2018
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.5277
Subject(s) - geology , raman spectroscopy , fault (geology) , context (archaeology) , mineralogy , mineral , subduction , texture (cosmology) , geochemistry , petrology , materials science , seismology , tectonics , paleontology , metallurgy , optics , physics , artificial intelligence , computer science , image (mathematics)
Submicron Raman spectroscopy mapping is able to unambiguously distinguish the main serpentine minerals within their in situ microstructural context. The high spatial resolution (~370 nm), large‐area coverage (up to hundreds of micrometres in each dimension), and ability to map directly on polished thin sections allows novel interpretations to be made regarding the nature and evolution of serpentinite fault rock textures. The potential of this method is illustrated by examining submicron‐scale textures of scaly serpentinites (e.g., dissolution seams, mineral growth in pressure shadows, distribution, and intergrowth of serpentine minerals) from a lithospheric‐scale shear zone in New Zealand and a subduction‐related serpentinite body in California, USA.