z-logo
Premium
Unraveling the electronic structure of transition metal dimers using resonant four‐wave mixing
Author(s) -
Visser B.,
Beck M.,
Bornhauser P.,
Knopp G.,
Gerber T.,
Abela R.,
Bokhoven J. A.,
Radi P. P.
Publication year - 2016
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.4841
Subject(s) - isotopologue , spectroscopy , chemistry , mixing (physics) , spectral line , degenerate energy levels , four wave mixing , transition metal , resonance (particle physics) , raman spectroscopy , laser , atomic physics , resonance raman spectroscopy , molecular physics , analytical chemistry (journal) , optics , nonlinear optics , molecule , physics , biochemistry , organic chemistry , quantum mechanics , astronomy , chromatography , catalysis
The potential of two‐color resonant and degenerate four‐wave mixing spectroscopy for investigations of the complex spectra of transition metal dimers is explored. Two‐color resonant and degenerate four‐wave mixing spectroscopy scans of the well‐known A‐X and B‐X transitions in Cu 2 are reported and compared with previous experimental data obtained from standard single‐resonance techniques. The selectivity of the method is shown to enable the measurement of isotopologue pure spectra without the need for isotopically enriched metal targets. Specific subsets of the rovibronic structure are separated in a congested spectral region of overlapping transitions. The sensitivity of the method compares satisfactorily with linear spectroscopic methods such as laser‐induced fluorescence and cavity ring‐down. A new laser vaporization source for the production of transition metal dimers and clusters has been constructed. The new design aims for a high number density and maximum possible shot‐to‐shot stability. The possibilities of further applications of non‐linear four‐wave mixing spectroscopy to Cu 2 and other transition metal dimers are discussed. Copyright © 2015 John Wiley & Sons, Ltd.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here